Advanced TappingMode AFM Operation

This section discusses the more subtle aspects involved in operating the Dimension Icon in TappingMode.

Without a thorough understanding of principles associated with cantilever resonating techniques, you may generate distorted data. Understanding the Cantilever Tune process and the effects of real-time scan parameters is critical for effective operation of the microscope. It is also important to understand similarities and differences between Contact Mode Force Calibration and TappingMode Force Calibration.

You will find the information in this section valuable in optimizing the TappingMode imaging capabilities of the Dimension Icon SPM.

• Cantilever Oscillation
• Decreasing the Cantilever Drive Frequency
• Manual Cantilever Tuning
• Parameter Settings
• Surface Tune

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